发明名称 PHASE INTERFERENCE MEASURING METHOD AND PHASE INTERFERENCE MEASURING INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To provide a technique for measuring polarized phase, having simple and high time resolving power. SOLUTION: A measurement evaluating apparatus A comprises a four light-wave mixture device 1B for generating by means of two light pulses, an image processing unit C which images with a CCD camera, by superimposing coaxially four light-wave mixtures and a gate pulse on the top of the same axis, and an information processor CP for analyzing an interference amplitude from the image acquired. In the optical measurement evaluating apparatus A, two pulsed lights L01 and L02 are turned into a wave number k<SB>1</SB>and a wave number k<SB>2</SB>, respectively. A four light-wave mixture phenomenon arises, by exciting a sample according to these pulses; whereas, a light pulse L03 is utilized as a gate for carrying out time resolution of the four light-wave mixture signals. A gate light pulse L03 is utilized as a gate for carrying out time resolution of the four light-wave mixture signals. The gate light pulse L03 is superimposed with the four light-wave mixture signals L04, and a space interference occurs. Wave-front phase difference occurs on the imaging surface of a photoelectric conversion element (charge-coupled device, CCD) 08, and a spatial interference fringe is formed. This image data is incorporated by a computer (CP) through an image board. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007298466(A) 申请公布日期 2007.11.15
申请号 JP20060128277 申请日期 2006.05.02
申请人 HOKKAIDO UNIV 发明人 TODA YASUNORI;ADACHI SATOSHI;YAMAGUCHI KAZUHARU
分类号 G01J9/02 主分类号 G01J9/02
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