发明名称 |
SERVER DEVICE, AND PROGRAM |
摘要 |
<p>[PROBLEMS TO BE SOLVED] In a conventional group management system, a problem is that, when abnormalities are analyzed after detection, time sequential information cannot be taken or displayed for every device of semiconductor manufacturing devices, and the like. [MEANS FOR SOLVING THE PROBLEMS] Data measured in a plurality of semiconductor manufacturing devices are time sequential information. The measured data have device identifiers for identifying the semiconductor manufacturing devices and time information, and a plurality of the measured data are stored. When abnormality is analyzed after detection, a chart output instruction including the device identifiers is received, and a plurality of the measured data having not less than one device identifier contained in the output instruction are read out. Charts in such a way that measured data are visually distinguishable for every device identifier are composed of the read out measured data. A server device that outputs the composed chart can take out the time sequential information for every device of the semiconductor manufacturing device, etc., and display the same.</p> |
申请公布号 |
WO2007129566(A1) |
申请公布日期 |
2007.11.15 |
申请号 |
WO2007JP58788 |
申请日期 |
2007.04.24 |
申请人 |
TOKYO ELECTRON LIMITED;MATOGAWA, KENJI;KOYAMA, NORIAKI |
发明人 |
MATOGAWA, KENJI;KOYAMA, NORIAKI |
分类号 |
G05B19/418;G01R31/00;G05B23/02;H01L21/02;H01L21/205;H01L21/3065;H01L21/66 |
主分类号 |
G05B19/418 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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