发明名称 DUTY CYCLE MEASUREMENT METHOD AND APPARATUS THAT OPERATES IN A CALIBRATION MODE AND A TEST MODE
摘要 The disclosed methodology and apparatus measure the duty cycle of a reference clock signal that a clock circuit supplies to a duty cycle measurement (DCM) circuit. In one embodiment, the DCM circuit includes a capacitor driven by a charge pump. The reference clock signal drives the charge pump. The clock circuit varies the duty cycle of the reference clock signal among a number of known duty cycle values. The DCM circuit stores resultant capacitor voltage values corresponding to each of the known duty cycle values in a data store. The DCM circuit applies a test clock signal having an unknown duty cycle to the capacitor via the charge pump, thus charging the capacitor to a new voltage value that corresponds to the duty cycle of the test clock signal. Control software accesses the data store to determine the duty cycle to which the test clock signal corresponds.
申请公布号 US2007266285(A1) 申请公布日期 2007.11.15
申请号 US20060381031 申请日期 2006.05.01
申请人 IBM CORPORATION 发明人 BOERSTLER DAVID W.;HAILU ESKINDER;QI JIEMING
分类号 G01R31/28 主分类号 G01R31/28
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