发明名称 MODULE TESTING DEVICE, MODULE TESTING METHOD, AND MODULE TESTING PROGRAM
摘要 PROBLEM TO BE SOLVED: To simply and surely implement tests without set errors at each pin, by referring a terminal array table and a testing condition table, matching classification only by designating the classification of a module by a worker, concerning a module testing device for performing the test at each pin of a measured object of the module, a module testing method and a module testing program. SOLUTION: The module testing device comprises the terminal array table for registering the testing condition table or the number of the testing condition tables at each pin of the measured object; the testing condition table for previously registering a testing condition or quality determination information; a testing means for performing the test, after setting the condition to the pin of the measured object and setting the condition on the other set pin, based on the testing condition table set on the pin of the measured object or of the number by referring the terminal array table; and a determination means for determining the quality, by collating the result tested by the testing means with the quality determination information set on the testing condition table. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007298423(A) 申请公布日期 2007.11.15
申请号 JP20060127134 申请日期 2006.04.29
申请人 FUJITSU LTD 发明人 MAESAKI YOSHIHIRO;TESHIGAWARA HIROSHI;KODAIRA YUKIHIKO;SEKIGUCHI HISAE
分类号 G01R31/28;G11C29/56 主分类号 G01R31/28
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