BRIGHTNESS INSPECTION APPARATUS FOR AN ARRAY SUBSTRATE AND BRIGHTNESS INSPECTION METHOD FOR THE SAME

摘要

A brightness inspection device for an array substrate and a brightness inspection method thereof are provided to achieve an accurate brightness inspection and prevent a brightness defect of the array substrate by performing brightness inspection on both a reflective area and a transmissive area of each pixel of the array substrate. A substrate in which a plurality of pixels is arranged in a matrix form is mounted on a stage(200). A light source provides light to the substrate in response to a driving signal of the substrate. A brightness sensing unit(500) measures brightness of each pixel of the substrate and outputs a brightness signal. A display unit provides the driving signal to the light source, and displays a brightness signal from the brightness sensing unit.