发明名称 SCATTERED RADIATION CORRECTION METHOD IN X-RAY COMPUTED TOMOGRAPH AND X-RAY COMPUTED TOMOGRAPH
摘要 PROBLEM TO BE SOLVED: To correct scattering in an X-ray computed tomography sufficiently taking account of individual proportion of an examination object while dispensing with an additional test scanning. SOLUTION: This scattered radiation correction method in the X-ray computed tomograph wherein the scattered radiation is determined based on a sinogram actually acquired from a scanning object 7 for correcting the scattered radiation in the X-ray computed tomograph having at least two X-ray sources, determines a latent scatter position Z on each measurement beam S<SB>M</SB>from the radiation tangent S<SB>T</SB>being determined by the sinogram in the examination object 7, and calculates the intensity of the scattered radiation based on angular relationship among the scatter beam S<SB>S</SB>(=primary radiation) incident on the scatter position Z, the scatter beam S<SB>S</SB>, and the radiation tangent S<SB>T</SB>and the measurement beam S<SB>M</SB>in the examination object 7. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007296338(A) 申请公布日期 2007.11.15
申请号 JP20070116640 申请日期 2007.04.26
申请人 SIEMENS AG 发明人 BRUDER HERBERT;STIERSTORFER KARL
分类号 A61B6/03 主分类号 A61B6/03
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