发明名称 ELECTRONIC LENS
摘要 <p>Provided is a small-size electronic lens having a small aberration for use in a microscope and an evaluation device using an electronic beam. The electronic lens is characterized in that its characteristic can be modified in a short time without using a complicated correction device. In the electronic lens, a correction electrode (11) is arranged in the vicinity of objective lenses (12, 13) as electrostatic lenses for correcting the aberration. Alternatively, a correction mechanism formed by a magnet is arranged in the vicinity of the objective lenses as magnetic lenses for correcting the aberration.</p>
申请公布号 WO2007129376(A1) 申请公布日期 2007.11.15
申请号 WO2006JP308728 申请日期 2006.04.26
申请人 TOPCON CORPORATION;YAMADA, KEIZO;MATSUZAWA, MINORU 发明人 YAMADA, KEIZO;MATSUZAWA, MINORU
分类号 H01J37/153;H01J37/143;H01J37/145;H01J37/12 主分类号 H01J37/153
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