发明名称 |
ELECTRONIC LENS |
摘要 |
<p>Provided is a small-size electronic lens having a small aberration for use in a microscope and an evaluation device using an electronic beam. The electronic lens is characterized in that its characteristic can be modified in a short time without using a complicated correction device. In the electronic lens, a correction electrode (11) is arranged in the vicinity of objective lenses (12, 13) as electrostatic lenses for correcting the aberration. Alternatively, a correction mechanism formed by a magnet is arranged in the vicinity of the objective lenses as magnetic lenses for correcting the aberration.</p> |
申请公布号 |
WO2007129376(A1) |
申请公布日期 |
2007.11.15 |
申请号 |
WO2006JP308728 |
申请日期 |
2006.04.26 |
申请人 |
TOPCON CORPORATION;YAMADA, KEIZO;MATSUZAWA, MINORU |
发明人 |
YAMADA, KEIZO;MATSUZAWA, MINORU |
分类号 |
H01J37/153;H01J37/143;H01J37/145;H01J37/12 |
主分类号 |
H01J37/153 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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