发明名称 SEMICONDUCTOR DEVICE, AND ITS FABRICATION PROCESS
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device in which a transistor of trench gate structure and Schottky barrier diode can be mounted mixedly, inexpensively, and to provide its fabrication process. SOLUTION: The semiconductor device comprises a semiconductor layer, a plurality of trenches provided on the major surface side of the semiconductor layer, an insulating film provided on the inner wall face and the upper portion of the trench, a conductive material filling the trench surrounded by the insulating film, a base region provided between the trenches, a source region provided at the surface layer of the base region, a semiconductor mesa portion provided between the trenches in a Schottky barrier diode region adjoining to a transistor region provided with the base region and the source region, a control electrode connected with the conductive material filling the trench in the transistor region, and a main electrode provided in contact with the surface of the source region and the semiconductor mesa portion wherein a portion of the conductive material provided in the Schottky barrier diode region is exposed partially from the insulating film and connected with the main electrode. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007299970(A) 申请公布日期 2007.11.15
申请号 JP20060127245 申请日期 2006.05.01
申请人 TOSHIBA CORP 发明人 ONO SHOTARO;KAWAGUCHI YUSUKE;YAMAGUCHI YOSHIHIRO;AKIYAMA MIWAKO
分类号 H01L29/78;H01L21/336;H01L29/41;H01L29/47;H01L29/872 主分类号 H01L29/78
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