发明名称 METHODS FOR FORMING FLOATING GATE MEMORY STRUCTURES
摘要 Dielectric regions ( 210 ) are formed on a semiconductor substrate between active areas of nonvolatile memory cells. The top portions of the dielectric region sidewalls are etched to recess the top portions laterally away from the active areas. Then a conductive layer is deposited to form the floating gates ( 410 ). The recessed portions of the dielectric sidewalls allow the floating gates to be wider at the top. The gate coupling ratio is increased as a result. Other features are also provided.
申请公布号 US2007264779(A1) 申请公布日期 2007.11.15
申请号 US20070828557 申请日期 2007.07.26
申请人 PROMOS TECHNOLOGIES INC. 发明人 HSIAO CHIA-SHUN;DING YI
分类号 H01L21/8247;H01L21/336;H01L27/115;H01L29/423 主分类号 H01L21/8247
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