发明名称 Coating method and solutions for enhanced electromigration resistance
摘要 The present invention concerns a methods and compositions for preparing a multi layer composite device, such as a semiconductor device. Said method comprises (A) forming a dielectric layer on the surface of a composite material by bringing said surface into contact: a) either with a solution, comprising the diazonium salt of aniline, a diazonium salt bearing at least one functional group or an amine compound of formula H<SUB>2</SUB>N-A-X-Z as defined in claim 1: b) or with a first solution containing an aryl diazonium salt and successively a second solution containing a compound bearing at least one functional group and bearing at least one functional group capable of reacting with the aryl radical grafted on the surface of the composite material thanks to the aryl diazonium salt; (B) forming an overlayer on said surface of said composite material obtained in step (A), said overlayer consisting of a Si-containing dielectric Cu-Etch Stop Layer and/or copper diffusion barrier.
申请公布号 US2007262449(A1) 申请公布日期 2007.11.15
申请号 US20070714435 申请日期 2007.03.05
申请人 ALCHIMER 发明人 BISPO ISABELLE;THIERIET NATHALIE;MANGIAGALLI PAOLO
分类号 H01L23/532;C07C245/20;H01L21/31 主分类号 H01L23/532
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