发明名称 Exposure device for wafer dividing system, has transferring unit for transferring wafer from grinding unit to plasma etching system, where transferring unit removes appropriate section of resist layer
摘要 <p>The device (3) has a transferring unit (4) for transferring a wafer from a grinding unit (2) to a plasma etching system. A resist covering unit (32) is provided for covering a rear side of the wafer using a resist layer. A drying unit (33) is provided for drying the resist layer. An exposure unit (34) for exposing the resist layer in order to remove the section of the resist layer. A developer unit (35) is provided for supplying a developer liquid of the resist layer and for removing a part of the resist layer. The transferring unit removes the appropriate section of the resist layer.</p>
申请公布号 DE102007021728(A1) 申请公布日期 2007.11.15
申请号 DE20071021728 申请日期 2007.05.09
申请人 DISCO CORP. 发明人 FUJISAWA, SHINICHI;ONO, TAKASHI
分类号 H01L21/301 主分类号 H01L21/301
代理机构 代理人
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