发明名称 |
Exposure device for wafer dividing system, has transferring unit for transferring wafer from grinding unit to plasma etching system, where transferring unit removes appropriate section of resist layer |
摘要 |
<p>The device (3) has a transferring unit (4) for transferring a wafer from a grinding unit (2) to a plasma etching system. A resist covering unit (32) is provided for covering a rear side of the wafer using a resist layer. A drying unit (33) is provided for drying the resist layer. An exposure unit (34) for exposing the resist layer in order to remove the section of the resist layer. A developer unit (35) is provided for supplying a developer liquid of the resist layer and for removing a part of the resist layer. The transferring unit removes the appropriate section of the resist layer.</p> |
申请公布号 |
DE102007021728(A1) |
申请公布日期 |
2007.11.15 |
申请号 |
DE20071021728 |
申请日期 |
2007.05.09 |
申请人 |
DISCO CORP. |
发明人 |
FUJISAWA, SHINICHI;ONO, TAKASHI |
分类号 |
H01L21/301 |
主分类号 |
H01L21/301 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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