| 摘要 |
<p>Sensors (100, 520) and systems for electrical, electrochemical, or topographical analysis, as well as methods of fabricating these sensors are provided The sensors include a cantilever (110, 524) and one or more probes (120, 522), each of which has an electrode (126) at its tip (122) The tips of the probes are sharp, with a radius of curvature of less than about 50 nm In addition, the probes have a high aspect ratio of more than about 19 :1. The sensors are suitable for both Atomic Force Microscopy and Scanning Electrochemical Microscopy.</p> |
| 申请人 |
THE BOARD OF TRUSTEES OF THE LELAND STANFORD JUNIOR UNIVERSITY;PRINZ, FRIEDRICH, B.;TAO, YE;FASCHING, RAINER, J.;GRECO, RALPH, S.;HAMMERICK, KYLE;SMITH, ROBERT, LANE |
发明人 |
PRINZ, FRIEDRICH, B.;TAO, YE;FASCHING, RAINER, J.;GRECO, RALPH, S.;HAMMERICK, KYLE;SMITH, ROBERT, LANE |
