发明名称 CARRIER MODULE FOR SEMICONDUCTOR TEST HANDLER
摘要 A carrier module for semiconductor test handler is provided to make supple the functioning of latches which fixes a semiconductor device, and to offer carrier module for semiconductor test handler which has simple structure. A carrier module is installed to rotate with the carrier body(11) that has a pocket part(13) on which a semiconductor device(S) is set safe as the carrier module rotates up and down on the axis(16) of both sides of pocket part(13); comprises one pair of latches(15) which fixes on the first position the semiconductor device(S) which is set safe on the pocket part(13) and move to the second place where the semiconductor device is released; comprises elastic members(18) which elastically supports the latches; and is formed to move to the second place by external force that external device(P) applies from lower part to upper part of the carrier body(11) and move back to the first place by elastic member(18).
申请公布号 KR20070109720(A) 申请公布日期 2007.11.15
申请号 KR20060043102 申请日期 2006.05.12
申请人 MIRAE CORPORATION 发明人 HYUN, SUNG UK;PARK, SUNG MUN
分类号 G01R31/26;H01L21/67 主分类号 G01R31/26
代理机构 代理人
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