| 摘要 |
The invention comprises a sensor for use in an atomic force microscope, with a cantilever (20) having at least one detection tip (30) and a detection probe (40). The detection probe (40) is attached to the at least one detection tip (30) and has a detection tip contact surface (32) shaped to substantially mate to at least a portion of the detection probe (40). The invention also provides a method for the manufacture of a sensor in which a cantilever (20) with at least one detection tip (30) is truncated such that the at least one detection tip (30) has a detection tip contact surface (32) shaped to substantially mate to at least a portion of the detection probe (40). Finally the detection probe (40) is attached to the substantially mating detection tip contact surface (32). |
