发明名称 Method for fabricating silicon nitride spacer structures
摘要 Embodiments of methods for fabricating a spacer structure on a semiconductor substrate are provided herein. In one embodiment, a method for fabricating a spacer structure on a semiconductor substrate includes providing a substrate containing a base structure over which the spacer structure is to be formed. The spacer structure may be formed over the base structure by depositing a first layer comprising silicon nitride on the base structure, depositing a second layer comprising a silicon-based dielectric material on the first layer, and depositing a third layer comprising silicon nitride on the second layer. The first, second, and third layers are deposited in a single processing reactor.
申请公布号 US7294581(B2) 申请公布日期 2007.11.13
申请号 US20050253229 申请日期 2005.10.17
申请人 APPLIED MATERIALS, INC. 发明人 IYER R. SURYANARAYANAN;TANDON SANJEEV
分类号 H01L21/30 主分类号 H01L21/30
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