发明名称 POLISHING PAD
摘要 A polishing pad is provided for uniformly planarizing a wafer surface in a short time. The polishing pad (10) is composed of a pad main body (11) having a polishing surface and a lining (12) fixed on a rear surface of the pad main body (11). The elastic modulus of the pad main body (11) is within a range of 600psi-16,000psi, preferably 1,600psi-16,000psi, when a compression pressure of 2psi to 16psi is applied. The thickness of the pad main body (11) is within a range of 0.5mm-3.0mm. The elastic modulus of the lining (12) is within a range lower than the elastic modulus of the pad main body (11) but higher than 300psi, when the above mentioned compression pressure is applied.
申请公布号 KR20070108850(A) 申请公布日期 2007.11.13
申请号 KR20077008767 申请日期 2007.04.18
申请人 NIHON MICRO COATING CO., LTD. 发明人 KOBAYASHI TOSHIHIRO;IZUMI TOSHIHIRO;TAMURA JUN;NAGAMINE TAKUYA;ARAHATA TAKASHI
分类号 H01L21/304;B24B37/20 主分类号 H01L21/304
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