| 摘要 |
A memory testing apparatus is provided with a writing section which writes predetermined test data on each page of a memory to be tested and tests the memory, a fail memory unit which stores test results of the memory. The fail memory unit comprises a writing-time measuring section to measure a writing time taken to write the test data, an accumulating section which accumulates the writing time over a predetermined plurality of pages, and a judging section which compares values accumulated by the accumulating section with predetermined expecting values and judges whether the memory to be tested is good or not.
|
