发明名称 INSPECTION APPARATUS AND INSPECTION METHOD OF DISPLAY PANEL
摘要 PROBLEM TO BE SOLVED: To provide an inspection apparatus of a display panel capable of improving the detection power of inspection process. SOLUTION: The inspection apparatus of display panels includes a probe unit 120 having a plurality of probe pins for applying electrical signal to a plurality of signal pads formed on the display panel; and a conductive film 110 that can move reciprocatively at the lower end of the probe unit. The inspection apparatus has a first mode, where the conductive film is interposed between the plurality of pads and the probe pin, when the conductive film moves forward; and a second mode, where the probe pin is connected directly on the plurality of signal pads, when the conductive film moves backward. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007292750(A) 申请公布日期 2007.11.08
申请号 JP20070097668 申请日期 2007.04.03
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 SONG YOUNG WOO;JEONG HWAN KYEONG;YOUN JIN CHUL;JUNG HWA KYU
分类号 G01M11/00;G01R31/00;G01R31/02;G02F1/13 主分类号 G01M11/00
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