发明名称 |
SEMICONDUCTOR DEVICE AND DRIVE CAPABILITY CONTROL METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of correcting the error of drive capability caused by variations in manufacturing easily, and to provide a method of controlling the drive capability in the semiconductor device. SOLUTION: The semiconductor device can select desired drive capability from a plurality of settings related to the drive capability. The semiconductor device has a drive capability adjustment part for adjusting the drive capability of the semiconductor device according to an inputted control signal, and a storage for storing error information for indicating an error in the measured value of the drive capability obtained by the inspection of the semiconductor device to a design value. A control signal corresponds to setting based on the error information stored in the storage. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2007295083(A) |
申请公布日期 |
2007.11.08 |
申请号 |
JP20060117957 |
申请日期 |
2006.04.21 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
YAMAUCHI MASASHI;AONO ETSURO |
分类号 |
H03K19/0175;H01L21/822;H01L27/04 |
主分类号 |
H03K19/0175 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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