| 摘要 |
<p>First and second data output circuits acquire corresponding portion of read data from a storage circuit in normal mode and second test mode, and output the acquired portion to first and second input/output pads. First and second data input circuits acquire and output written data from the storage circuit through the first and the second input/output pads in the normal mode, and acquire and output the outputted data from the first and the second output circuits through the first and the second input/output pads in the second test mode. A comparison object selection circuit selects and outputs read data from the storage circuit in the first test mode, and selects and outputs the outputted data from the first and the second data input circuits in the second test mode. A judging circuit performs test judgment by comparing outputted data from the comparison object selection circuit with expected value data in the first test mode and the second test mode, and outputs test result signals.</p> |
