发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To obtain a method of manufacturing semiconductor devices for manufacturing a semiconductor device with satisfactory productivity by simple processes. SOLUTION: The manufacturing method comprises: a process for forming a plurality of gate electrodes on a semiconductor substrate via a gate insulation film; a process for forming an insulation film for covering the gate electrode; a process for exposing the surface of the gate electrode; a process for forming a metal film having a large etching selection ratio to the insulation film on the semiconductor substrate, and for etching the metal film to form a silicification prevention film for preventing silicification in the gate electrode on the gate electrode that does not perform silicification at least in the gate electrodes; a process for forming a metal film for forming a silicide film on the gate electrode that is not covered with the silicification prevention film; a process for allowing the gate electrode to react with the metal film to silicify the gate electrode; a process for removing an unreacted metal film in the metal film for forming a silicide film and the silicification prevention film; and a process for forming an interlayer insulating film on the semiconductor substrate. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2007294589(A) |
申请公布日期 |
2007.11.08 |
申请号 |
JP20060119295 |
申请日期 |
2006.04.24 |
申请人 |
RENESAS TECHNOLOGY CORP |
发明人 |
TSUTSUMI TOSHIAKI;OKUDAIRA TOMOHITO;KASHIWABARA KEIICHIROU;YAMAGUCHI SUNAO |
分类号 |
H01L21/8234;H01L21/28;H01L27/088;H01L29/423;H01L29/49 |
主分类号 |
H01L21/8234 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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