发明名称 Lithographic apparatus and device manufacturing method using interferometric and other exposure
摘要 A lithographic apparatus including an exposure unit that exposes parallel lines on a target area of a substrate by projecting two beams of radiation onto the substrate. The two beams of radiation are projected such that they interfere with each other to form the parallel lines. An actuator continuously moves the substrate relative to the exposure unit, while the exposure unit exposes the parallel lines on the target areas on the substrate.
申请公布号 US2007258078(A1) 申请公布日期 2007.11.08
申请号 US20060417210 申请日期 2006.05.04
申请人 ASML NETHERLANDS B.V. 发明人 TROOST KARS Z.;BASELMANS JOHANNES J.M.;GREENEICH JAMES S.
分类号 G03B27/58 主分类号 G03B27/58
代理机构 代理人
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