发明名称 DEFORMATION MEASURING DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a deformation measurement device for measuring the deformation from a variation in electric output capable of highly sensitively measuring minute deformation, further miniaturized so as to be able to detect a deformation in a small region. SOLUTION: The deformation measurement device comprises an insulation substrate, at least a pair of electrode arranged on the insulation substrate, the channel for connecting the electrode pair. The channel is including two or more conductor bodies separated so as to carry the tunnel current. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007292618(A) 申请公布日期 2007.11.08
申请号 JP20060121276 申请日期 2006.04.25
申请人 HOKKAIDO UNIV 发明人 TAKAHASHI TSUNEO;ARITA MASASHI
分类号 G01B7/16 主分类号 G01B7/16
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