发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device whose threshold voltage is easily controlled, and which can be operated at a low voltage. SOLUTION: A source area 40 and a drain area 50 are separately located on a semiconductor substrate 20 element-separated by an element separating area 30. A gate electrode 70 formed through a gate insulating film 60 is formed between the source area 40 and the drain area 50. On the interface between the gate insulating film 60 and the gate electrode 70, a plurality of particles of silicon nitride 80 are scatteringly buried in the gate electrode 70 in contact with the gate insulating film 60. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007294874(A) 申请公布日期 2007.11.08
申请号 JP20070037169 申请日期 2007.02.16
申请人 SANYO ELECTRIC CO LTD 发明人 FUJIWARA HIDEAKI;FUJITA KAZUNORI;YAMAOKA YOSHIKAZU;MIZUHARA HIDEKI;INOUE YASUNORI
分类号 H01L29/78;H01L21/768;H01L21/8247;H01L23/522;H01L27/115;H01L29/423;H01L29/49;H01L29/788;H01L29/792 主分类号 H01L29/78
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