发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device whose threshold voltage is easily controlled, and which can be operated at a low voltage. SOLUTION: A source area 40 and a drain area 50 are separately located on a semiconductor substrate 20 element-separated by an element separating area 30. A gate electrode 70 formed through a gate insulating film 60 is formed between the source area 40 and the drain area 50. On the interface between the gate insulating film 60 and the gate electrode 70, a plurality of particles of silicon nitride 80 are scatteringly buried in the gate electrode 70 in contact with the gate insulating film 60. COPYRIGHT: (C)2008,JPO&INPIT |
申请公布号 |
JP2007294874(A) |
申请公布日期 |
2007.11.08 |
申请号 |
JP20070037169 |
申请日期 |
2007.02.16 |
申请人 |
SANYO ELECTRIC CO LTD |
发明人 |
FUJIWARA HIDEAKI;FUJITA KAZUNORI;YAMAOKA YOSHIKAZU;MIZUHARA HIDEKI;INOUE YASUNORI |
分类号 |
H01L29/78;H01L21/768;H01L21/8247;H01L23/522;H01L27/115;H01L29/423;H01L29/49;H01L29/788;H01L29/792 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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