X-RAY IMAGE PICKING-UP DEVICE AND X-RAY IMAGE PICKING-UP METHOD

摘要

An X-ray image picking-up device and its method are provided to use a continuous X-ray for picking up an image with a high sensitivity based on X-ray phase information. An object (2) is set in a space existing from an X-ray source (1) to a third grid (5) (e.g., a space defined between a second grid (4) and the third grid (5)). A continuous X-ray beam is irradiated from the X-ray source (1) to the first grid (3). The second grid (4) diffracts an X-ray diffracted by the first grid (3). The first and second grids (3) and (4) selectively make an X-ray with a specific band wavelength penetrate. Further, an X-ray diffracted by the second grid (4) forms its own image. The image is observed through the third grid (5). In consequence, based on the principle of Talbot interferometer, a contrast of the object is generated. An X-ray diffracted by the third grid (5) is detected by an X-ray image detector (6). With this, such a structure of the object that an absorbed contrast does not depict can be observed.