发明名称 DEVICE FOR TESTING EDGE OF GLASS SUBSTRATE AND METHOD THEREOF
摘要 An apparatus for testing an edge of a glass substrate and a method thereof are provided to remarkably enhance the yield rate of a test by promptly and accurately testing a defect of the edge of the glass substrate. An apparatus for testing an edge of a glass substrate includes a transfer section(100), a fixed scan module(200), a movable scan module(300), and a control section. The transfer section transfers the glass substrate in one direction. The fixed scan module is separated from both sides of one surface of the glass substrate by a focus distance to scan both edges of the glass substrate that is being transferred. The movable scan module is linearly and reciprocally moved along a front section of the glass substrate. The movable scan module scans the front edge of the glass substrate and scans the rear edge of the glass substrate. The control section collects the scanned image in the scan modules to determine a defect of the edge of the glass substrate.
申请公布号 KR100775024(B1) 申请公布日期 2007.11.08
申请号 KR20060050635 申请日期 2006.06.07
申请人 K.C.TECH CO., LTD. 发明人 BAEK, WOON YOUNG;NA, SUN BOK
分类号 G01N21/896;G01B11/30;G01N21/88 主分类号 G01N21/896
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