发明名称 Structures and Methods of a Bistable Resistive Random Access Memory
摘要 Structures and methods to form a bistable resistive random access memory for reducing the amount of heat dissipation from electrodes by confining a heating region in the memory cell device are described. The heating region is confined in a kernel comprising a programmable resistive memory material that is in contact with an upper programmable resistive memory member and a lower programmable resistive memory member. The lower programmable resistive member has sides that align with sides of a bottom electrode comprising a tungsten plug. The lower programmable resistive member and the bottom electrode function a first conductor so that the amount of heat dissipation from the first conductor is reduced. The upper programmable resistive memory material and a top electrode function as a second conductor so that the amount of heat dissipation from the second conductor is reduced.
申请公布号 US2007257300(A1) 申请公布日期 2007.11.08
申请号 US20060381973 申请日期 2006.05.05
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 HO CHIAHUA;LAI ERH-KUN;HSIEH KUANG Y.
分类号 H01L29/788;H01L21/336;H01L21/8234;H01L21/8244 主分类号 H01L29/788
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