发明名称 Multilayer interconnect structure containing air gaps and method for making
摘要 A multilevel air-gap-containing interconnect structure and a method of fabricating the same are provided. The multilevel air-gap-containing interconnect structure includes a collection of interspersed line levels and via levels, with via levels comprising conductive vias embedded in one or more dielectric layers in which the dielectric layers are solid underneath and above line features in adjacent levels, and perforated between line features. The line levels contain conductive lines and an air-gap-containing dielectric. A solid dielectric bridge layer, containing conductive contacts and formed by filling in a perforated dielectric layer, is disposed over the collection of interspersed line and via levels.
申请公布号 US2007259516(A1) 申请公布日期 2007.11.08
申请号 US20060429708 申请日期 2006.05.08
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 JAHNES CHRISTOPHER V.;NITTA SATYANARAYANA V.;PETRARCA KEVIN S.;SAENGER KATHERINE L.
分类号 H01L21/4763 主分类号 H01L21/4763
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