发明名称 System for Low-Energy Plasma-Enhanced Chemical Vapor Deposition
摘要 A system ( 10 ) for low-energy plasma-enhanced chemical vapor deposition comprising plasma source ( 100 ), deposition chamber ( 200 ) and gas distribution system ( 300 ) for semiconductor epitaxy on substrates up to 300 mm in size is described. The system ( 10 ) allows for fast switching from high to low deposition rates, and film thickness control at the monolayer level. It incorporates chamber self-cleaning and the provisions for selective epitaxial growth. The system ( 10 ) contains a broad-area plasma source ( 100 ) which can be used also in other applications, such as low-energy ion implantation and plasma treatment of surfaces.
申请公布号 US2007259130(A1) 申请公布日期 2007.11.08
申请号 US20050569799 申请日期 2005.04.22
申请人 VON KAENEL HANS;HAID REINHARD 发明人 VON KAENEL HANS;HAID REINHARD
分类号 C23C16/00;C23C16/503;H01J37/32 主分类号 C23C16/00
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