发明名称 A PHOTOMASK INCLUDING PELLICLE ALIGNMENT KEY, PELLICLE ALIGNMENT KEY, AN APPARATUSS FOR MOUNTING A PELLICLE AND METHOD FOR MOUNTING A PELLICLE THEREOF
摘要 <p>A photomask, a pellicle alignment key, and a pellicle mounting apparatus and method are provided to stabilize a process of fabricating a semiconductor device by accurately mounting the pellicle on a surface of the photomask. A photomask includes a photomask substrate(210), a pellicle(220) mounted on the photomask substrate, and a pellicle alignment key formed on the photomask substrate. The pellicle alignment key is formed around a corner or side of the pellicle. A spacing between the pellicle alignment key and the pellicle is measured by a measuring pattern.</p>
申请公布号 KR20070107344(A) 申请公布日期 2007.11.07
申请号 KR20060039705 申请日期 2006.05.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 NO, YOUNG HWA;JANG, SUNG HOON;BANG, JU MI;KANG, SUN
分类号 H01L21/027 主分类号 H01L21/027
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