发明名称 |
Semiconductor wafer and manufacturing method thereof |
摘要 |
A semiconductor wafer and its manufacturing method are provided where the current driving capability of a MOS transistor can be sufficiently enhanced. An SOI layer wafer in which an SOI layer ( 32 ) is formed has a <100> crystal direction notch ( 32 a) and a <110> crystal direction notch ( 32 b). The SOI layer wafer and a supporting substrate wafer ( 1 ) are bonded to each other in such a way that the notch ( 32 a) and a <110> crystal direction notch ( 1 a) of the supporting substrate wafer ( 1 ) coincide with each other. When bonding the two wafers by using the notch ( 32 a) and the notch ( 1 a) to position the two wafers, the other notch ( 32 b) of the SOI layer wafer can be engaged with a guide member of the semiconductor wafer manufacturing apparatus to prevent positioning error due to relative turn between the wafers. Thus an MOS transistor with a sufficiently improved current driving capability can be fabricated on the semiconductor wafer with the two wafers positioned in crystal directions shifted from each other.
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申请公布号 |
US7291542(B2) |
申请公布日期 |
2007.11.06 |
申请号 |
US20050223970 |
申请日期 |
2005.09.13 |
申请人 |
RENESAS TECHNOLOGY CORP. |
发明人 |
IWAMATSU TOSHIAKI;MAEDA SHIGENOBU |
分类号 |
H01L21/30;H01L27/12;H01L21/02;H01L21/336;H01L21/46;H01L21/68;H01L21/762;H01L23/544;H01L29/786 |
主分类号 |
H01L21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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