发明名称 |
One-time programmable circuit exploiting BJT hFE degradation |
摘要 |
A one-time programmable circuit uses forced BJT h<SUB>FE </SUB>degradation to permanently store digital information as a logic zero or logic one state. The forced degradation is accomplished by applying a voltage or current to the BJT for a specific time to the reversed biased base-emitter junction, allowing a significant degradation of the junction without destroying it.
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申请公布号 |
US7292066(B2) |
申请公布日期 |
2007.11.06 |
申请号 |
US20050115538 |
申请日期 |
2005.04.27 |
申请人 |
STMICROELECTRONICS, INC.;STMICROELECTRONICS S.A.;STMICROELECTRONICS SRL |
发明人 |
ALINI ROBERTO;ROVATI SERGIO STEFANO;VANDENBOSSCHE ERIC;PASKINS CHRISTOPHER |
分类号 |
H03K19/082 |
主分类号 |
H03K19/082 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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