发明名称 One-time programmable circuit exploiting BJT hFE degradation
摘要 A one-time programmable circuit uses forced BJT h<SUB>FE </SUB>degradation to permanently store digital information as a logic zero or logic one state. The forced degradation is accomplished by applying a voltage or current to the BJT for a specific time to the reversed biased base-emitter junction, allowing a significant degradation of the junction without destroying it.
申请公布号 US7292066(B2) 申请公布日期 2007.11.06
申请号 US20050115538 申请日期 2005.04.27
申请人 STMICROELECTRONICS, INC.;STMICROELECTRONICS S.A.;STMICROELECTRONICS SRL 发明人 ALINI ROBERTO;ROVATI SERGIO STEFANO;VANDENBOSSCHE ERIC;PASKINS CHRISTOPHER
分类号 H03K19/082 主分类号 H03K19/082
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