发明名称 |
Power supply assembly for a semiconductor circuit tester |
摘要 |
A power supply assembly includes a dielectric substrate and a power supply circuit supported by the dielectric substrate. A conductive connection block is attached to the dielectric substrate at a main surface thereof and is connected to a power supply terminal of the power supply circuit. A spring probe pin is fitted in a bore formed in the connection block and includes a conductive sleeve and a conductive plunger fitted in the sleeve. The conductive sleeve is in electrically conductive contact with the connection block.
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申请公布号 |
US7292059(B2) |
申请公布日期 |
2007.11.06 |
申请号 |
US20050096337 |
申请日期 |
2005.03.31 |
申请人 |
CREDENCE SYSTEMS CORPORATION |
发明人 |
DEVEY WILLIAM;MILLER WILL A.;DELUCCO ANTHONY |
分类号 |
G01R31/36 |
主分类号 |
G01R31/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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