发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
<p>A semiconductor device and a fabricating method thereof are provided to prevent a bonding region from being damaged due to a probe tip by physically separating the probing region and the bonding region using a protruding pattern. A wiring layer(102) is formed on a substrate(100), and has a first pad contact region(102a) and a second pad contact region(102b). A passivation layer(103) has a first opening(105a) exposing the first pad contact region, a second opening(105b) exposing the second pad contact region, and a protruding patterns(104) separating the first and second openings. A pad metal pattern is conformally formed along the first and second openings and the protruding pattern.</p> |
申请公布号 |
KR100772903(B1) |
申请公布日期 |
2007.11.05 |
申请号 |
KR20060103017 |
申请日期 |
2006.10.23 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SHIN, JI YOUNG;PARK, HYUNG MOO |
分类号 |
H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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