发明名称 DOUBLE GATED TRANSISTOR AND METHOD OF FABRICATION
摘要 A method for forming a transistor. A semiconductor substrate is provided. The semiconductor substrate is patterned to provide a first body edge. A first gate structure of a first fermi level is provided adjacent the first body edge. The semiconductor substrate is patterned to provide a second body edge. The first and second body edges of the semiconductor substrate define a transistor body. A second gate structure of a second fermi level is provided adjacent the second body edge. A substantially uniform dopant concentration density is formed throughout the transistor body.
申请公布号 US2007254438(A1) 申请公布日期 2007.11.01
申请号 US20070774663 申请日期 2007.07.09
申请人 发明人 BRYANT ANDRES;IEONG MEIKEI;MULLER K. P.;NOWAK EDWARD J.;FRIED DAVID M.;RANKIN JED
分类号 H01L21/336 主分类号 H01L21/336
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