发明名称 APPARATUS FOR PROCESSING SUBSTRATE AND PROCESS FOR PRODUCING SUBSTRATE
摘要 <p>An apparatus for substrate processing in which the step of removing a substance to be treated is not complicated, the temperatures of the substance to be treated and a wet ozonous gas are easily controlled, and even a photoresist having ions implanted in a high dose can be removed. An inert gas (2) is bubbled into a treating liquid (3) to produce a wet inert gas (4). The wet inert gas (4) is mixed with ozone gas (5) to produce a wet ozonous gas (6). The wet ozonous gas (6) is heated to 120-200°C and supplied to a photoresist (7a) heated to 180-350°C. Thus, the photoresist (7a) is ashed while instantly vaporizing the treating liquid (3) which has adhered to the photoresist (7a).</p>
申请公布号 WO2007123197(A1) 申请公布日期 2007.11.01
申请号 WO2007JP58616 申请日期 2007.04.20
申请人 ZENKYO CORPORATION;ROKI TECHNO CO., LTD.;ANDO, HAJIME;OHTAKE, KIYOSHI;MIKAMI, YUTAKA 发明人 ANDO, HAJIME;OHTAKE, KIYOSHI;MIKAMI, YUTAKA
分类号 H01L21/304;H01L21/027 主分类号 H01L21/304
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