发明名称 |
NON VOLATILE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
<p>An NVM(non-volatile memory) device is provided to improve charge storage capacity by forming a charge storage layer having a stack structure of a high dielectric layer, silicon and a high dielectric layer. A lower insulation layer(13) is formed on a substrate(11). A charge storage layer(17) is formed on the lower insulation layer. An upper insulation layer(18) is formed on the charge storage layer. A gate electrode(19) is formed on the upper insulation layer. The charge storage layer is composed of a first dielectric layer on the lower insulation layer, a silicon layer formed on a first silicate layer, and a second dielectric layer formed on the oxide layer. The lower and upper insulation layers are made of a high dielectric layer having a dielectric constant of 3.9 or higher.</p> |
申请公布号 |
KR20070106168(A) |
申请公布日期 |
2007.11.01 |
申请号 |
KR20060038728 |
申请日期 |
2006.04.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHO, HEUNG JAE;LEE, SEUNG RYONG;KIM, TAE YOON |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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