发明名称 NON VOLATILE MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>An NVM(non-volatile memory) device is provided to improve charge storage capacity by forming a charge storage layer having a stack structure of a high dielectric layer, silicon and a high dielectric layer. A lower insulation layer(13) is formed on a substrate(11). A charge storage layer(17) is formed on the lower insulation layer. An upper insulation layer(18) is formed on the charge storage layer. A gate electrode(19) is formed on the upper insulation layer. The charge storage layer is composed of a first dielectric layer on the lower insulation layer, a silicon layer formed on a first silicate layer, and a second dielectric layer formed on the oxide layer. The lower and upper insulation layers are made of a high dielectric layer having a dielectric constant of 3.9 or higher.</p>
申请公布号 KR20070106168(A) 申请公布日期 2007.11.01
申请号 KR20060038728 申请日期 2006.04.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO, HEUNG JAE;LEE, SEUNG RYONG;KIM, TAE YOON
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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