发明名称 FLAW DETECTION METHOD AND FLAW DETECTOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a flaw detection method capable of accurately detecting display flaws, such as stain. <P>SOLUTION: The flaw detection method has a flaw emphasis processing method S4 for enhancing a flaw part by adapting a secondary difference filter, with respect to a photographed image, a luminance gradient detection processing process S5 for detecting luminance gradient, with respect to the photographed image and an error-detecting and deciding process S6. The error-detecting and deciding process S6 is equipped with a flaw region candidate extraction process for comparing the flaw enhanced image obtained in the flaw enhancement treatment method S4 with a predetermined threshold, to extract a flaw region candidate, the maximum luminance acquisition process for acquiring the maximum luminance in the extracted flaw region candidate; a maximum luminance gradient acquiring process for acquiring the maximum luminance gradient, in the same region as the flaw region candidate in the luminance gradient image obtained in the luminance gradient detection processing process S5; and a flaw region deciding process for deciding whether the flaw region candidate is a flaw region, on the basis of the maximum luminance and the maximum luminance gradient. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007285754(A) 申请公布日期 2007.11.01
申请号 JP20060110804 申请日期 2006.04.13
申请人 SEIKO EPSON CORP 发明人 KOJIMA KOICHI;ICHIKAWA HIRONARI;MURAKAMI TAKUSHI
分类号 G01N21/88;G01M11/00;G06T1/00 主分类号 G01N21/88
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