发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device that is capable of preventing mechanical and thermal damages to a semiconductor device and is excellent in reliability and productivity. <P>SOLUTION: The method for manufacturing a semiconductor device forms an electrode on the semiconductor device, forms a conductive bump on the electrode, disposes an external wiring on the conductive bump, and laser-welds the external wiring and the conductive bump so as to be electrically connected. Thus, this allows a preferable method to be provided to manufacture a semiconductor device for a big current application or a low resistance application. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007288013(A) 申请公布日期 2007.11.01
申请号 JP20060115133 申请日期 2006.04.19
申请人 NEC ELECTRONICS CORP 发明人 TANAKA MASAKAZU;TAKAHASHI KOHEI
分类号 H01L21/60 主分类号 H01L21/60
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