发明名称 FORMING METHOD OF INSULATING FILM, MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND PLASMA CVD APPARATUS
摘要 PROBLEM TO BE SOLVED: To improve an insulating film by sufficiently performing deviation of an organic material gas while suppressing an increase in temperature in forming the insulating film using the organic material gas as a gas to be a material by a plasma CVD method. SOLUTION: A forming method of an insulating film is executed using a plasm CVD method on a substrate. In the plasma CVD method, the organic material gas is used as a gas to be a material of an insulating film, and a high-frequency power applied for generating plasma is applied with a constant time interval. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007287890(A) 申请公布日期 2007.11.01
申请号 JP20060112725 申请日期 2006.04.14
申请人 KOCHI UNIV OF TECHNOLOGY 发明人 HIRAO TAKASHI;FURUTA HIROSHI;FURUTA MAMORU
分类号 H01L21/316;C23C16/44;C23C16/505;H01L21/283;H01L21/31;H01L21/336;H01L21/768;H01L29/786 主分类号 H01L21/316
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