发明名称 X-RAY ANALYZER USING ELECTRON BEAM
摘要 PROBLEM TO BE SOLVED: To carry out analysis, under analytical conditions suitable for an analytical point with different compositions, and to automatically set suitable analytical conditions, even when an unknown compound exists, when analyzing the large number of analytical points containing the plurality of compositions by a wavelength dispersive X-ray spectroscopy (WDS). SOLUTION: The quantitative analysis is carried out in the every analytical point by an energy dispersive X-ray spectroscopy (EDS), having the feature of simple and short-time analysis, at step S71, and the compound is determined based on a result thereof at S72. The suitable analysis conditions are selected, based on the determination result thereof when the compound is a new compound, the analysis conditions are read from a database in an S76, when the compound is a compound registered already in the database, and the quantitative analysis is carried out by the WDS. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007285786(A) 申请公布日期 2007.11.01
申请号 JP20060111493 申请日期 2006.04.14
申请人 JEOL LTD 发明人 NOTOYA TOMOHITO
分类号 G01N23/225 主分类号 G01N23/225
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