发明名称 ADAPTER AND ELECTRONIC COMPONENT TESTING DEVICE PROVIDED WITH THE SAME
摘要 PROBLEM TO BE SOLVED: To provide an adapter, without leaving existing test head but effectively utilizing existing performance board. SOLUTION: The adaptor for adapting the conventional performance board 30' to the test head 20A for testing the IC device, by bringing the IC device into electrical contact with the new performance board, in place of new performance board, comprises a first connection board 110 capable of electrically connecting with the test head 20A, a second connection board 120 capable of electrically connecting with the conventional performance board 30', and a third connection board 130 for electrically connecting the first connection board 110 and the second connection board 120. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007285775(A) 申请公布日期 2007.11.01
申请号 JP20060111274 申请日期 2006.04.13
申请人 ADVANTEST CORP 发明人 IBATA TAKEHIRO;SAKURAI TOKIJI
分类号 G01R31/28 主分类号 G01R31/28
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