发明名称 Method for manufacturing a semiconductor device
摘要 A method for manufacturing a semiconductor device includes forming a copper anti-diffusion film on a copper trench wiring layer, and forming an opening portion in the copper anti-diffusion film by laser aberration, the opening portion being formed in a region corresponding to an alignment region used for lithography process for forming an aluminum wiring on the copper trench wiring layer.
申请公布号 US2007254474(A1) 申请公布日期 2007.11.01
申请号 US20070790723 申请日期 2007.04.27
申请人 SHINOMIYA HIDEO;HIROTA JUN;MATSUO MIE;KANEKO HISASHI 发明人 SHINOMIYA HIDEO;HIROTA JUN;MATSUO MIE;KANEKO HISASHI
分类号 H01L21/4763 主分类号 H01L21/4763
代理机构 代理人
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