发明名称 |
MONITORING IONIZING RADIATION IN SILICON-ON INSULATOR INTEGRATED CIRCUITS |
摘要 |
A method, device and system for monitoring ionizing radiation. The method including: collecting an ionizing radiation induced charge collected by the depletion region of a diode formed in a silicon layer below an oxide layer buried below a surface of a silicon substrate; and coupling a cathode of the diode to a precharged node of a clocked logic circuit such that the ionizing radiation induced charge collected by a depletion region of the diode will discharge the precharged node and change an output state of the clocked logic circuit.
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申请公布号 |
US2007252088(A1) |
申请公布日期 |
2007.11.01 |
申请号 |
US20060380736 |
申请日期 |
2006.04.28 |
申请人 |
ABADEER WAGDI W;CANNON ETHAN H;COX DENNIS T;TONTI WILLIAM R |
发明人 |
ABADEER WAGDI W.;CANNON ETHAN H.;COX DENNIS T.;TONTI WILLIAM R. |
分类号 |
G01T1/02 |
主分类号 |
G01T1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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