发明名称 Method and apparatus for solving mask precipitated defect issue
摘要 Disclosed are a method and an apparatus for solving mask precipitated defect issue. A gas is purged into a photomask reticle assembly for diffusing precipitated defects out of a photomask in the photomask reticle assembly. A metal shielding assembly enclosing the photomask reticle assembly is provided for reducing precipitated defects and damages to the photomask. In an illustrative embodiment, the metal shielding assembly comprises an upper metal shielding, a pellicle frame of the photomask reticle assembly, side support frames of the photomask reticle assembly, a top cover, a handle, and a handle cover.
申请公布号 US2007254217(A1) 申请公布日期 2007.11.01
申请号 US20060413447 申请日期 2006.04.28
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 DAI YI-MING
分类号 G02B26/00;G02F1/155;G03F1/00 主分类号 G02B26/00
代理机构 代理人
主权项
地址