| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for measuring the surface structure of an object existing in a near field area. <P>SOLUTION: A light source generates at least a first light beam and a second light beam, and the first and second light beams are guided to be inputted to an SIL so that they may contact the surface of an object. This method can be used, for example, in a near field optical disk storage system in which the intensity of the reflected light of the first and second light beams is used to measure two distances between the SIL and an optical disk in two points corresponding to the first and second light beams. A tilt angle or an average distance between the disk and the SIL, or a surface structure such as roughness of the surface of the disk are obtained by analyzing the positions and the distances. The first and second light beams are generated, for example, by a diffraction technology or a single laser diode which emits a plurality of beams. <P>COPYRIGHT: (C)2008,JPO&INPIT |
