| 摘要 |
A test tray for a semiconductor device test handler is provided to improve the reliability of a test by connecting a semiconductor device and a socket of a test head always accurately. A test tray(10) for a semiconductor device test handler includes a base(11) and a plurality of mounting plates(12). The base and the mounting plate are made of a thermal conductive material. The mounting plate is combined to a side of the base to be separated with predetermined interval. A plurality of mounting parts(13) in which semiconductor devices(S) are mounted is formed in the mounting plate. A guide hole(14) being inserted into a guide pin for guiding connection of a test head is formed in both side end of the mounting plate. |
