| 摘要 |
PROBLEM TO BE SOLVED: To reduce the number of external terminals of semiconductor integrated circuit required to implement self-test by a self-test circuit. SOLUTION: The semiconductor integrated circuit is equipped with a first external terminal into which a test signal is input, a second external terminal into which a clock signal is input from exterior, a self-test circuit implementing self-tests in response to the clock signal input from the aforementioned second external terminal, a third external terminal outputing test discrimination signal output from the aforementioned self-test circuit outward, an external output controlling circuit controlling output of the aforementioned test discrimination signal from the aforementioned third external terminal, based on the aforementioned test signal input from the aforementioned first external terminal and test termination signal output from the aforementioned self-test circuit, and a clock signal input controlling circuit controlling input of the aforementioned clock signal input from the aforementioned second external terminal to the aforementioned self-test circuit, based on the aforementioned test discrimination signal and the aforementioned test termination signal. COPYRIGHT: (C)2008,JPO&INPIT
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