发明名称 |
TESTING APPARATUS, TESTING METHOD, JITTER FILTER CIRCUIT AND JITTER FILTERING METHOD |
摘要 |
<p>Provided is a testing apparatus for evaluating devices to be tested. The testing apparatus is provided with an extracting section for extracting a jitter component from an output signal outputted from the device to be tested; a filter for passing through a prescribed frequency component in the jitter component; a phase control section for controlling the phase of the output signal, based on the jitter component outputted from the filter; and an evaluating section for evaluating the device to be tested, based on a signal outputted from the phase control section.</p> |
申请公布号 |
WO2007123055(A1) |
申请公布日期 |
2007.11.01 |
申请号 |
WO2007JP58117 |
申请日期 |
2007.04.12 |
申请人 |
ADVANTEST CORPORATION;ISHIDA, MASAHIRO;ICHIYAMA, KIYOTAKA;YAMAGUCHI, TAKAHIRO |
发明人 |
ISHIDA, MASAHIRO;ICHIYAMA, KIYOTAKA;YAMAGUCHI, TAKAHIRO |
分类号 |
G01R23/175;G01R29/02;G01R23/165;G01R29/18;G01R31/28 |
主分类号 |
G01R23/175 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|