发明名称 Test Mode For Pin-Limited Devices
摘要 A pin-limited device includes a pattern-recognition circuit that detects a predetermined signal pattern transmitted on a supply pin of the device. The predetermined signal pattern is generated within the acceptable operating voltage range of the IC device (e.g., between the minimum and maximum acceptable system voltage levels utilized to control the internal circuitry of the device). Accordingly, the pin-limited IC device continues to operate within specifications while the predetermined signal pattern is transmitted on the selected power supply pin or pins. A test mode circuit generates a switch control signal in response to the predetermined signal pattern to connect an output pin of the device, for example, to an internal node of the device. The pattern recognition circuit sets a latch when the predetermined signal pattern is detected, and the latch is reset when the device is powered down then powered up.
申请公布号 US2007255984(A1) 申请公布日期 2007.11.01
申请号 US20060278942 申请日期 2006.04.06
申请人 MICREL, INCORPORATED 发明人 YEE PHILIP W.
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址
您可能感兴趣的专利